Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy

  • Diego Pereira Leite Group of Métodos de Análisis Rápidos con Técnicas Espectroscópicas (M.A.R.T.E.) - Department of Analytical Chemistry, Aragón Institute of Engineering Research (I3A), University of Zaragoza, Pedro Cerbuna 12, 50009 Zaragoza, Spain
  • Eduardo Bolea-Fernandez Department of Analytical Chemistry, Ghent University, Campus Sterre, Krijgslaan 281-S12, 9000 Ghent, Belgium,
  • Ana Rúa Ibarz Department of Analytical Chemistry, Ghent University, Campus Sterre, Krijgslaan 281-S12, 9000 Ghent, Belgium,
  • Martín Resano Group of Métodos de Análisis Rápidos con Técnicas Espectroscópicas (M.A.R.T.E.) - Department of Analytical Chemistry, Aragón Institute of Engineering Research (I3A), University of Zaragoza, Pedro Cerbuna 12, 50009 Zaragoza, Spain
  • Frank Vanhaecke Department of Analytical Chemistry, Ghent University, Campus Sterre, Krijgslaan 281-S12, 9000 Ghent, Belgium,
  • Maite Aramendía

Resumen

This work uses the tandem ICP-MS (ICPMS/MS) for obtaining interference-freeconditions to characterize SiO2 nanoparticles ranging between 80 and 400nm. These NPs have been detected and accurately characterized. For SiO2 NPs >100 nm, it was possible to provide accurateresults in a straightforward way, as theirsignal distributions are well resolved fromthat of the background.

Biografía del autor/a

Maite Aramendía

Group of Métodos de Análisis Rápidos con Técnicas Espectroscópicas (M.A.R.T.E.) - Department of Analytical Chemistry, Aragón Institute of Engineering Research (I3A), University of Zaragoza, Pedro Cerbuna 12, 50009 Zaragoza, Spain

CCentro Universitario de la Defensa de Zaragoza, Academia General Militar de Zaragoza, Carretera de Huesca s/n, 50090 Zaragoza, Spain

 

Publicado
2017-06-01