Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy
ResumenThis work uses the tandem ICP-MS (ICPMS/MS) for obtaining interference-freeconditions to characterize SiO2 nanoparticles ranging between 80 and 400nm. These NPs have been detected and accurately characterized. For SiO2 NPs >100 nm, it was possible to provide accurateresults in a straightforward way, as theirsignal distributions are well resolved fromthat of the background.
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