Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy
DOI:
https://doi.org/10.26754/jji-i3a.201711962Resumen
This work uses the tandem ICP-MS (ICPMS/MS) for obtaining interference-freeconditions to characterize SiO2 nanoparticles ranging between 80 and 400nm. These NPs have been detected and accurately characterized. For SiO2 NPs >100 nm, it was possible to provide accurateresults in a straightforward way, as theirsignal distributions are well resolved fromthat of the background.Descargas
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Publicado
2017-06-01
Cómo citar
Pereira Leite, D., Bolea-Fernandez, E., Rúa Ibarz, A., Resano, M., Vanhaecke, F., & Aramendía, M. (2017). Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy. Jornada De Jóvenes Investigadores Del I3A, 5(1). https://doi.org/10.26754/jji-i3a.201711962
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Artículos (Procesos y Reciclado)