[1]
Pereira Leite, D., Bolea-Fernandez, E., Rúa Ibarz, A., Resano, M., Vanhaecke, F. y Aramendía, M. 2017. Characterization of SiO2 Nanoparticles by Single Particle - Inductively Coupled Plasma – Tandem Mass Spectroscopy. Jornada de Jóvenes Investigadores del I3A. 5, 1 (jun. 2017). DOI:https://doi.org/10.26754/jji-i3a.201711962.