MARQUÉS-GARCÍA, Jorge; PÉREZ-BAILON, Jorge; SÁNCHEZ AZQUETA, Carlos. Experimental characterization of nano-CMOS integrated resistors at cryogenic temperatures. . Jornada de Jóvenes Investigadores del I3A, [S. l.], v. 11, 2023. DOI: 10.26754/jjii3a.20239072. Disponível em: https://papiro.unizar.es/ojs/index.php/jji3a/article/view/9072. Acesso em: 11 dec. 2025.