Experimental characterization of nano-CMOS integrated resistors at cryogenic temperatures.
DOI:
https://doi.org/10.26754/jjii3a.20239072Abstract
This work studies the behaviour of CMOS integrated resistors in a temperature range from room temperature to ultra-low temperature (4 K). It is shown that the temperature coefficient α cannot be linearly approximated even if the approximation condition (αΔT<<<1) is fulfilled for cryogenic temperatures.
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Published
2023-07-07
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Artículos (Tecnologías de la Información y las Comunicaciones)
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Copyright (c) 2023 Jorge Marqués-García, Jorge Pérez-Bailon, Carlos Sánchez Azqueta

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
How to Cite
Marqués-García, J., Pérez-Bailon, J., & Sánchez Azqueta, C. (2023). Experimental characterization of nano-CMOS integrated resistors at cryogenic temperatures . Jornada De Jóvenes Investigadores Del I3A, 11. https://doi.org/10.26754/jjii3a.20239072